LUM Universal Test Stamp, W-Cu/AL: Type L TSU-L, 8 stamps; 8 guiding sleeves 200-13281

The LUM GmbH Universal Test Stamp, W-Cu/AL: Type L TSU-L is a set that includes 8 stamps and 8 guiding sleeves. These stamps are designed for use in testing applications to measure adhesion or bond strength in various materials. They are commonly used in industries where adhesion quality is critical, such as aerospace, automotive, and construction.

Key Features:

• Includes 8 stamps and 8 guiding sleeves
• Designed for adhesion testing applications
• Suitable for measuring bond strength in materials

Advantages:

• Allows for precise and accurate adhesion testing
• Ideal for industries where adhesion quality is crucial
• Facilitates reliable measurement of bond strength