LUM Universal Test Stamp, Cu/AL: Type L TSU-L, 8 stamps(long); 8 guiding sleeves 200-11281

The LUM GmbH Universal Test Stamp, Cu/AL: Type L TSU-L is a product that likely serves as a tool for mechanical testing or bonding applications. The stamps and guiding sleeves suggest a setup for precise testing procedures or adhesive bonding with metal materials.

Key Features:

• Set includes 8 stamps (long) and 8 guiding sleeves
• Designed for mechanical testing or bonding applications
• Likely made of Cu/AL materials
• Provides a standardized tool for consistent and accurate testing

Advantages:

• Facilitates precise and repeatable testing processes
• Ensures consistent results in mechanical testing or bonding applications
• Standardized setup improves reliability of test outcomes
• Compatible with various testing procedures requiring stamping or guiding sleeves